1
Surface engineering 2001 : fundamentals and applications : symposium held November 26-29, 2001, Boston, Massachusetts, USA [ at the 2001 MRS fall meeting] /
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Self-organized processes in semiconductor alloys : [Symposium I, Self-Organized Processes in Semiconductor Alloys - Spontaneous Ordering, Composition Modulation, and 3-D Islanding] held November 29 - December 2, 1999, Boston, Massachusetts, USA [ at the 1999 MRS fall meeting] /
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3
Surface and near-surface analysis of materials : proceedings of Topical Symposium II - "Surface and Near-Surface Analysis of Materials" of the Forum on New Materials of the 9th CIMTEC - World Congress and Forum on New Materials : Florence, Italy June 14-19, 1998 /
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Characterization and metrology for ULSI technology : 1998 international conference Gaithersburg, Maryland [23. - 27.] March 1998 : [the 1998 International Conference on Characterization and Metrology for ULSI Technology] /
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Arbeitstagung angewandte Oberflächenanalytik. 9 : Kurzfassung der Vorträge Aachen, 24.06.96-27.06.96.
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6
Surface physics : China Center of Advanced Science and Technology (world laboratory) symposium/workshop proceedings vol 0009 : CCAST (world laboratory) symposium/workshop proceedings vol 0009 : Beijing, 27.05.91-31.05.91.
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Li, X.
1992
“...FHAB - Surface and thin film characterization...”
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7
Dünnschichttechnologien 1992: Statusseminar : Dünnschichttechnologien: Statusseminar 0003 : 01.06.92-03.06.92 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.
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8
Surface X-ray and neutron scattering: international conference 0002: proceedings : Bad-Honnef, 25.06.91-28.06.91.
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Zabel, H.
1992
“...FHAB - Surface and thin film characterization...”
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9
Arbeitstagung angewandte Oberflächenanalytik. 7 : Kurzfassung der Vorträge der 7. Arbeitstagung vom 22. - 25. Juni 1992 im Forschungszentrum Jülich /
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Dünnschichttechnologien 1990 : Statusseminar Vol 1 : 27.06.90-29.06.90 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.
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11
Chemistry and physics of solid surfaces. 0008 : International summer institute in surface science. 0009: review articles : ISISS. 1989: review articles : Milwaukee, WI, 08.89.
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12
Vacuum and surface analysis. vol 0003 : Sino - German joint seminar on vacuum and surface analysis: proceedings : VASA. 1988: proceedings : Shanghai, 21.10.88-23.10.88.
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Hua, Z. Y.
1990
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13
Surface analysis techniques and applications : papers presented at an international symposium U.M.I.S.T., Manchester, 11-13th September 1989 /
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Neagle, W.
1990
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14
Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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15
Surface and interface characterization by electron optical methods : NATO advanced study institute on the study of surfaces and interfaces by electron optical techniques: proceedings : Erice, 04.04.87-15.04.87 /
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Howie, A.
1988
“...FHAB - Surface and thin film characterization...”
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16
Vacuum and surface analysis. vol 0002 : Sino - us joint seminar on vacuum and surface analysis: proceedings : Vasa. 1987: proceedings. 1 : Beijing, 08.09.87-10.09.87.
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Hua, Z. Y.
1988
“...FHAB - Surface and thin film characterization...”
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17
Vacuum and surface analysis. vol 0001 : Chinese Japanese Joint Seminar on Vacuum and Surface Analysis: proceedings : VASA : 1985: proceedings : Shanghai, 26.10.85-28.10.85.
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Hua, Z.
1988
“...FHAB - Surface and thin film characterization...”
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18
Dünnschichttechnologien 1988: Statusseminar : 25.05.88-27.05.88 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.
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19
Arbeitstagung angewandte Oberflächenanalytik. 5 : Kurzfassung der Beiträge Jülich, 21.06.88-24.06.88.
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1988
“...FHAB - Surface and thin film characterization...”
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20
Surface characterization and testing : San-Diego, CA, 21.08.86-22.08.86 /
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Creath, K.
1987
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