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SIMS (secondary ion mass spectroscopy)
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SIMS (secondary ion mass spectroscopy)
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1
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Surface analysis - the principal techniques /
Vickerman, John C.
2013
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ion
scattering
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Select result number 2
2
Book
Applied atomic collision physics. 4. Condensed matter.
Datz, S.
1983
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...
ion
scattering
...
”
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ZB
2
IFN-1
1
Name
Datz, S.
1
Vickerman, John C.
1
Subject
Auger electron spectroscopy
2
SIMS (secondary ion mass spectroscopy)
ion scattering
2
X-ray fluorescence analysis
1
electron spectroscopy
1
ion beam processing
1
more ...
ion beam solid interaction
1
ion microprobe analysis
1
ion microscopy
1
ion source
1
ion surface collision
1
photoelectron spectroscopy
1
scanning probe microscopy
1
surface analysis
1
surface vibrational spectroscopy
1
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Classification
CUP - Vibrational spectroscopy
1
FFGC - Electron spectroscopy
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
Language
English
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