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imaging technique
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Determining nanoscale physical properties of materials by microscopy and spectroscopy: symposium : Boston, MA, 29.11.93-03.12.93.
Sarikaya, M.
1994
Subject (ZB):
“
...electron
diffraction
...
”
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Sarikaya, M.
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III - V semiconductor
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atomic spectroscopy
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dynamic properties
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FAP - Advanced materials - development and applications
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