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materials characterization
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nanostructures
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1
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Nanocharacterisation /
Kirkland, August I.
2007
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Nanosilicon: properties, synthesis, applications, methods of analysis and control /
Ischenko, Anatoly A.
2015
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ZB
2
IFF
1
Name
Aslanov, Leonid A.
1
Fetisov, Gennady V.
1
Ischenko, Anatoly A.
1
Kirkland, August I.
1
Subject
materials characterization
nanostructures
nanotechnology
X-ray analysis
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X-ray diffraction
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electron microscopy
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holography
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luminescence
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nanostructured material
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porous silicon
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quantum dot
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scanning electron microscopy
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scanning transmission electron microscopy
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semiconductor
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silicon
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surface modification
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thermal properties
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thin film technology
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tomography
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FGN - Nanotechnology
2
FNPE - Nanostructured materials
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FFGC - Electron spectroscopy
1
FHA - Materials characterization - general aspects
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FHEE - X-ray microscopy, surface topography
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