Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
X-ray scattering
Reset Filters
Show filters (1)
X-ray scattering
Ask a Librarian
Books & more
: Hits
1 - 3
of
3
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
[Proceedings of the Annual Conference on Applications of X-ray Analysis. 39 : held July 31-August 4, 1995, in Colorado Springs, Colorado] /
Gilfrich, John V.
1997
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Annual conference on applications of X-ray analysis. 43. Proceedings : Steamboat-Springs, CO, 01.05.94-05.05.94 /
Predicki, P. K.
1995
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Charakterisierung von dünnen Schichten und von Gläsern mit Röntgenreflexion und Röntgenfluoreszenzanalyse bei streifendem Einfall [E-Book] /
Hüppauf, Martin
1993
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Full text
JuSER
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Print Edition
2
Electronic Edition
1
Material Type
Book
3
Type of Literature
Conference Publication
2
Theses
1
Year of Publication
From:
To:
Location
ZB
3
Name
Gilfrich, John V.
1
Hüppauf, Martin
1
Predicki, P. K.
1
Subject
X-ray scattering
X-ray analysis
2
X-ray source
2
diffraction
2
instrumentation
2
mechanical stress
2
more ...
polymer
2
powder diffraction
2
semiconductor
2
X-ray diffraction
1
X-ray fluorescence analysis
1
X-ray spectroscopy
1
application
1
film
1
strain
1
surface structure
1
thin film
1
see all ...
less ...
Classification
CUK - X-ray spectroscopy
3
FFJ - Surface structure, gas solid interface
1
FHCB - X-ray scattering
1
Language
English
2
German
1
/* End Narrow Search Options */ ?>
×
Loading...