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Books & more: Hits 41 - 51 of 51

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Fourier transforms and their physical applications.

Champeney, D. C.
1973

“...FHC - Diffraction methods in materials characterization...”

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Strukturaufklärung : Spektroskopie und Röntgenbeugung.

Doerffel, K.
1973

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Strukturaufklärung : Spektroskopie und Röntgenbeugung /

Steger, E.
1973

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$Advances in structure research by diffraction methods. 4.$

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Advances in structure research by diffraction methods. 4.

Hoppe, W.
1972

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$Advances in structure research by diffraction methods. 3.$

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Advances in structure research by diffraction methods. 3.

Brill, R.
1970

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Electromagnetic scattering : ICES II : proceedings of the Second Interdisciplinary Conference on Electromagnetic Scattering held at the University of Massachusetts at Amherst, June...

Rowell, Robert L.
1967

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$Advances in structure research by diffraction methods. 2.$

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Advances in structure research by diffraction methods. 2.

Brill, R.
1966

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$Advances in structure research by diffraction methods. 1.$

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Advances in structure research by diffraction methods. 1.

Brill, R.
1964

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The interaction of radiation with solids : Solid state physics: international summer school : Mol, 12.08.63-31.08.63.

Strumane, R.
1964

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$Direct analysis of diffraction by matter /$

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Direct analysis of diffraction by matter /

Hosemann, Rolf
1962

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$Solution of a diffraction problem /$

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Solution of a diffraction problem /

Nussenzveig, H. M.
1957

“...FHC - Diffraction methods in materials characterization...”

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Print Edition 48 Electronic Edition 3

Book 51

Handbook, Textbook 10 Conference Publication 8 Theses 2 Collection of Tables 2 Collection of Formulas 1

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ZB 46 IBN-3-4 5 IFF 5 JCNS-4 3 IAS-9 1 IEK-2 1 more ... IEK-4 1 IKP 1 ZEA-2 1 see all ... less ...

Brill, R. 3 Cowley, John M. 3 Hoppe, W. 3 Spiess, Lothar 3 Amelinckx, Severin 2 Angst, Manuel 2 more ... Brückel, Thomas 2 Friese, Karen 2 Förster, Stephan 2 Gevers, R. 2 Pecharsky, Vitalij K. 2 Van Landuyt, Joseph 2 Zavalij, Peter Y. 2 Zorn, Reiner 2 Baba-Kishi, Karim Z. 1 Bagchi, Soumendra Narain 1 Behnken, Herfried 1 Behnken, Herfried. 1 Borsali, Redouane 1 Brandon, David. 1 Braun, Wolfgang. 1 Butler, W. H. 1 Champeney, D. C. 1 Chen, Huimin. 1 Cohen, J. B. 1 Cohen, Philip I. 1 David, W. I. F. 1 Dawson, B. 1 Dingley, David J. 1 Dinnebier, Robert E. 1 see all ... less ...

X-ray diffraction 11 diffraction 10 electron diffraction 6 neutron diffraction 6 powder diffraction 6 crystallography 5 more ... light scattering 4 scattering 4 X-ray crystallography 3 diffraction analysis 3 materials characterization 3 optical properties 3 Fourier transform 2 NMR (nuclear magnetic resonance) 2 X-ray powder diffraction 2 X-ray scattering 2 X-ray spectroscopy 2 electron microscopy 2 infrared spectroscopy 2 instrumentation 2 measurement 2 microstructure analysis 2 multiple scattering 2 neutron scattering 2 neutron spectroscopy 2 optical spectroscopy 2 pattern formation 2 small angle scattering 2 solid state spectroscopy 2 surface analysis 2 see all ... less ...

FHC - Diffraction methods in materials characterization 51 FHCB - X-ray scattering 9 FCAD - Crystal structure analysis 8 FCAB - X-ray crystallography, X-ray diffraction 7 FHE - Imaging methods in materials characterization 5 FCA - Crystallography 4 more ... FHN - Neutron scattering 4 FHA - Materials characterization - general aspects 3 FHG - Electron microscopy 3 CUO - Molecular spectroscopy 2 CUS - Light scattering 2 CUU - Magnetic resonance spectroscopy 2 FAAA - Crystallography - reference books 2 FAF - Materials research - comprehensive works 2 FHGE - Electron diffraction 2 FJNC - Optical spectroscopy in solids 2 CUA - Spectroscopy 1 CUK - X-ray spectroscopy 1 CUKF - X-ray fluorescence analysis 1 FAN - Solid state physics - mathematical methods, computer applications 1 FCDE - Symmetry in condensed matter 1 FDF - Radiation effects in solids 1 FDFE - Radiation effects in nonmetals, optical radiation effects 1 FFGC - Electron spectroscopy 1 FFJ - Surface structure, gas solid interface 1 FFP - Physics of thin films 1 FGKC - Vacuum deposition, MBE 1 FHCH - Microstructural analysis 1 FHEE - X-ray microscopy, surface topography 1 FJN - Optical properties of solids 1 see all ... less ...

English 10 German 3

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