ZB 123 IBN-3-4 6 IBN-1-2 2 IFF 2 IBI-2 1 IEK-9 1 more ... PGI-3 1 PGI-7 1 see all ... less ...

Hawkes, Peter W. 29 Amelinckx, Severin 5 Barer, R. 3 Van Landuyt, Joseph 3 Bonnell, Dawn A. 2 Diaspro, Alberto 2 more ... Gevers, R. 2 Miller, M. K. 2 Mulvey, T. 2 Wiesendanger, Roland 2 Anselmetti, Dario 1 Authier, Andre 1 Bai, Chunli 1 Balibar, Francoise. 1 Banhart, John 1 Bard, Allen J. 1 Behm, R. J. 1 Bergner, J. 1 Bernst, R. M. 1 Beyer, H. 1 Blab, Marcus 1 Bonse, U. 1 Bowen, D. Keith. 1 Bowkett, K. M. 1 Bradbury, S. 1 Briggs, A. 1 Briggs, G. A. D. 1 Buzug, T. M. 1 Buzug, Thorsten M. 1 Celano, Umberto 1 see all ... less ...

imaging technique 35 force microscopy 21 scanning tunneling microscopy 21 scanning probe microscopy 16 optical microscopy 13 electron microscopy 12 more ... image processing 11 microscopy 11 image analysis 7 X-ray microscopy 6 materials characterization 6 acoustic microscopy 5 instrumentation 5 holography 4 semiconductor 4 surface analysis 4 X-ray topography 3 confocal microscopy 3 fluorescence microscopy 3 materials science 3 nanoparticle 3 scanning electron microscopy 3 signal processing 3 NMR (nuclear magnetic resonance) 2 atom probe field ion microscopy 2 biological material 2 charge transport 2 electron emission 2 electron microscope 2 electron optics 2 see all ... less ...

FHE - Imaging methods in materials characterization 64 FHEG - Tunneling microscopy, force microscopy 32 FHEC - Optical microscopy in materials characterization 19 FHG - Electron microscopy 12 FHEM - Image analysis in microscopy, stereology 8 FHEE - X-ray microscopy, surface topography 6 more ... FHEH - Ion microscopy 5 DYK - Image processing 4 CUH - Luminescence, fluorescence analysis 3 FAN - Solid state physics - mathematical methods, computer applications 3 FHA - Materials characterization - general aspects 3 FNPE - Nanostructured materials 3 FHAB - Surface and thin film characterization 2 FHC - Diffraction methods in materials characterization 2 FKG - Magnetic materials 2 CTHD - Potentiometry 1 CUK - X-ray spectroscopy 1 CUSE - Raman spectroscopy 1 DPA - Electronic data processing - applications 1 EISF - Thin film solar cells 1 FAHH - Materials research - historical aspects 1 FANE - Computational solid state physics 1 FFGH - Electron emission, field emission 1 FGM - Microelectronic technology 1 FHCH - Microstructural analysis 1 FHJ - Scanning electron microscopy, analytical electron microscopy 1 FJH - Semiconductor physics 1 FMGH - Metallographic microscopy, metallographic stereology 1 FMHF - Grain boundaries, polycrystals 1 FNX - Carbon, carbon materials 1 see all ... less ...

English 67 German 3