ZB 117 IBN-3-4 15 IBN-1-2 2 IBG-1 1 IBI-2 1 IEK-9 1 more ... IFF 1 PGI-3 1 PGI-7 1 see all ... less ...

Wiesendanger, Roland 5 Morita, Seizo 4 Bonnell, Dawn A. 3 Anselmetti, Dario 2 Bai, Chunli 2 Behm, R. J. 2 more ... Bennewitz, Roland 2 Blab, Marcus 2 Celano, Umberto 2 Chen, C. Julian 2 Chen, Julian C. 2 Chiang, S. 2 Green, Matthew Felix Blishen 2 Güntherodt, Hans-Joachim 2 Hamers, R. J. 2 Joachim, C. 2 Kalinin, Sergei 2 Kichin, Georgy 2 Korte, Stefan 2 Lüpke, Felix 2 Meyer, Ernst 2 Ratinen, H. 2 Reichenberg, Bernd 2 Röhrig, Serge 2 Sarid, D. 2 Schaefer, Hans-Eckhardt 2 Schnedler, Michael 2 Van Bentum, P. J. M. 2 Weiss, Christian 2 Wirth, Ingo 2 see all ... less ...

scanning tunneling microscopy 96 force microscopy 43 scanning probe microscopy 26 surface analysis 11 instrumentation 8 imaging technique 7 more ... nanostructures 6 semiconductor surface 5 surface dynamics 5 surface structure 5 charge transport 4 nanoparticle 4 nanostructured material 4 platinum 4 quantum dot 4 surface 4 thin film 4 titanate 4 III - V semiconductor 3 defect analysis 3 fullerenes 3 gold 3 low temperature 3 materials characterization 3 monomolecular film 3 morphology 3 nanotechnology 3 scanning electron microscopy 3 semiconductor 3 silicon 3 see all ... less ...

FHEG - Tunneling microscopy, force microscopy 128 FHAB - Surface and thin film characterization 16 FFJ - Surface structure, gas solid interface 7 FHE - Imaging methods in materials characterization 7 FNX - Carbon, carbon materials 7 FHA - Materials characterization - general aspects 6 more ... FFJB - Surface dynamics 5 FFJE - Molecular surface processes, gas surface interaction, adsorption 4 FHJ - Scanning electron microscopy, analytical electron microscopy 4 FJKC - III - V semiconductors 4 FGN - Nanotechnology 3 FJHE - Defects and radiation effects in semiconductors 3 CLJE - Catalyst characterization and surface phenomena 2 CLP - Colloid chemistry, surface chemistry 2 CUSE - Raman spectroscopy 2 FFA - Surface science, surface physics - general aspects 2 FGKC - Vacuum deposition, MBE 2 FHEC - Optical microscopy in materials characterization 2 FJH - Semiconductor physics 2 FJKB - Elemental semiconductors 2 FLE - Superconductor materials 2 CHNK - Quantum chemistry - special aspects 1 CNOP - Transport phenomena in electrolytes 1 CNRO - Electrode processes 1 DPA - Electronic data processing - applications 1 FAN - Solid state physics - mathematical methods, computer applications 1 FCD - Crystal physics 1 FDCH - Defects in metals 1 FEJH - Low dimensional materials, intercalation compounds 1 FFGC - Electron spectroscopy 1 see all ... less ...

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