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FJHE - Defects and radiation effects in semiconductors
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FJHE - Defects and radiation effects in semiconductors
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1
Book
Microscopy of semiconducting materials 1991 : Conference on the microscopy of semiconducting materials: proceedings : Institute of Physics conference: proceedings : Oxford, 25.03.9...
Cullis, A. G.
1991
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FHG
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Electron
microscopy
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2
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Microscopy of semiconducting materials. 1989 : Royal Microscopical Society conference: proceedings : Conference on the microscopy of semiconducting materials: proceedings : Oxford,...
Cullis, A. G.
1989
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FHG
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3
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Microscopy of semiconducting materials. 1987 : Oxford, 06.04.87-08.04.87.
Cullis, A. G.
1987
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Microscopy of semiconducting materials. 1985 : Proceedings : Oxford, 25.03.1985-27.03.1985.
Cullis, A. G.
1985
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Microscopy of semiconducting materials 1983 : Invited and contributed papers : Oxford, 21.03.83-23.03.83.
Cullis, A. G.
1983
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Microscopy of semiconducting materials. 1981 : Proceedings of the Royal Microscopical Soc. Conference, Oxford, 6.-10.4.1981.
Cullis, A. G.
1981
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FHG
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Electron
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...
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6
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6
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ZB
6
Name
Cullis, A. G.
6
Subject
electron microscopy
3
semiconductor
3
Classification
FGML - Characterization of electronic materials
6
FHG - Electron microscopy
6
FJHE - Defects and radiation effects in semiconductors
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