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Pfefferkorn, G.
19
Johari, O.
16
Becker, R. P.
7
Albrecht, Ralph M.
6
Hawkes, Peter W.
5
Roomans, G. M.
4
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Newbury, Dale E.
3
Reimer, L.
3
Reimer, Ludwig
3
Schaaber, O.
3
Brederoo, P.
2
Goldstein, Joseph
2
Goldstein, Joseph.
2
Goodhew, Peter J.
2
Holt, D. B.
2
Joy, David C.
2
Pfefferkorn, Gerhard.
2
Reimer, Ludwig.
2
Schwartz, Adam J.
2
Zubkov, Evgeniy
2
Anders, Michael
1
Balk, L. J.
1
Barnard, Tudor
1
Bauer, H. D.
1
Baumeister, W.
1
Beaman, Donald Robert.
1
Bethge, Heinz
1
Bhushan, Bharat
1
Birkner, Alexander
1
Blaschke, R.
1
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scanning electron microscopy
61
electron microscopy
18
scanning tunneling microscopy
15
transmission electron microscopy
13
microanalysis
9
X-ray microanalysis
7
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analytical electron microscopy
7
electron diffraction
7
electron microprobe analysis
5
electron optics
4
electron spectroscopy
3
image processing
3
imaging technique
3
microscopy
3
scanning transmission electron microscopy
3
surface microscopy
3
Auger electron spectroscopy
2
defect
2
electrochemistry
2
electron energy loss spectroscopy
2
force microscopy
2
high resolution
2
high temperature superconductor
2
holography
2
microelectronics
2
microstructure analysis
2
nanostructures
2
proton
2
sample preparation
2
scanning probe microscopy
2
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FHJ - Scanning electron microscopy, analytical electron microscopy
159
FHG - Electron microscopy
22
FHJC - Microbeam analysis
10
FHEM - Image analysis in microscopy, stereology
8
FMGH - Metallographic microscopy, metallographic stereology
7
FMGJ - Fractography
5
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DYK - Image processing
4
FHE - Imaging methods in materials characterization
4
FHEG - Tunneling microscopy, force microscopy
4
LRH - Cytology - methods
4
FFGC - Electron spectroscopy
3
FHGB - Conventional electron microscopy
3
CUP - Vibrational spectroscopy
2
FFGH - Electron emission, field emission
2
FGME - Microlithography
2
FHEC - Optical microscopy in materials characterization
2
FHEE - X-ray microscopy, surface topography
2
FHGE - Electron diffraction
2
FJHE - Defects and radiation effects in semiconductors
2
AHZ - History of science and technology
1
CNE - Electrochemistry
1
CNRO - Electrode processes
1
CTYR - Microanalysis
1
CUA - Spectroscopy
1
CUKF - X-ray fluorescence analysis
1
CWOC - Characterization and size measurement of particles
1
FAE - Materials research - general interest
1
FCD - Crystal physics
1
FFJK - Surface reactions
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
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