1
Light element analysis in the transmission electron microscope: WEDX and EELS.
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“...Oxford science publications....”
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2
Characterization of particles : Microbeam analysis society: annual conference 0013 : Ann-Arbor, MI, 22.06.78 /
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“...National Bureau of Standards special publication ;...”
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3
Electron beam microanalysis.
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“...ASTM special technical publication ;...”
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4
Energy dispersion X-ray analysis: X-ray and electron probe analysis : Annual meeting American Society for Testing and materials 0073 : Symposium on energy dispersion X-ray analysis: X-ray and electron probe analysis : Toronto, 21.06.70-26.06.70.
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“...ASTM special technical publication ;...”
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5
Quantitative electron probe microanalysis /
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“...National Bureau of Standards special publication ;...”
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6
Symposium on X-ray and electron probe analysis : Annual meeting American Society for Testing and Materials 0066 : Atlantic-City, NJ, 27.06.63.
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1964
“...ASTM special technical publication ;...”
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7
Techniques of electron microscopy, diffraction, and microprobe analysis : Annual meeting of the American Society for Testing and Materials 0066 : Symposium on electron metallography: papers : Atlantic-City, NJ, 26.06.63.
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1964
“...ASTM special technical publication ;...”
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8
Symposium on advances in electron metallography and electron probe microanalysis : Atlantic-City, NJ, 28.06.60 ; 26.06.61.
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1962
“...ASTM special technical publication ;...”
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