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FHAB - Surface and thin film characterization
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FHAB - Surface and thin film characterization
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Instrumental surface analysis of geologic materials /
Perry, Dale L. ;
1990
Subject (ZB):
“
...secondary
ion
emission
...
”
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ZB
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Name
Perry, Dale L. ;
1
Subject
Auger electron spectroscopy
1
ESR (electron spin resonance)
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Fourier transform infrared spectroscopy
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NMR (nuclear magnetic resonance)
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electron spectroscopy
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luminescence
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mass spectroscopy
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photoelectron spectroscopy
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scanning electron microscopy
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secondary ion emission
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Classification
FHAB - Surface and thin film characterization
GKK - Geophysics - applications
1
GMAC - Isotope geochemistry
1
GMK - Geochemistry of elements, minerals, rocks
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