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1
Book
Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
Benninghoven, A.
1984
Subject (ZB):
“
...secondary
ion
emission
...
”
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2
Book
Ion formation from organic solids: international conference 0002: proceedings : IFOS 0002: proceedings : Münster, 07.09.1982-09.09.1982.
Benninghoven, A.
1983
Subject (ZB):
“
...
ion
emission
...
”
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3
Book
Secondary ion mass spectrometry: international conference 0003: proceedings : SIMS 0003: proceedings : Budapest, 30.08.81-05.09.81.
Benninghoven, A.
1982
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“
...secondary
ion
emission
...
”
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4
Book
Ecoss 0002 : European conference on surface science 0002 : Interdisciplinary surface science conference 0004 : Cambridge, 26.03.79-29.03.79.
Williams, P. M. C.
1979
Subject (ZB):
“
...
ion
emission
...
”
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4
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4
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ZB
4
IEK-14
2
IBN-3-4
1
IFF
1
Name
Benninghoven, A.
3
Williams, P. M. C.
1
Subject
SIMS (secondary ion mass spectroscopy)
2
ion emission
2
secondary ion emission
2
chemisorption
1
desorption
1
organic crystal
1
more ...
surface electronic properties
1
surface physics
1
surface reaction
1
surface state
1
surface structure
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Classification
FGGJ - Ion beam analysis, ion beam solid interaction
3
FFA - Surface science, surface physics - general aspects
1
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