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Breitenstein, Otwin
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Breitenstein, Otwin
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Lock-in thermography : basics and use for evaluating electronic devices and materials /
Breitenstein, Otwin
2018
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“
...
nondestructive
testing
...
”
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IEK-5
1
Name
Breitenstein, Otwin
Schubert, Martin C.
1
Warta, Wilhelm
1
Subject
infrared detector
1
integrated circuit
1
nondestructive testing
1
solar cell
1
thermography
1
Classification
TBTK - Infrared systems
1
Language
English
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