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Moyer, Patrick J.
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Moyer, Patrick J.
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1
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Near-field optics : theory, instrumentation, and applications /
Paesler, Michael A.
1996
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Development, physics, and applications of near field scanning optical microscopy.
Moyer, Patrick J.
1993
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optical
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IBI-6
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Moyer, Patrick J.
Paesler, Michael A.
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optical microscopy
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scanning
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FHEC - Optical microscopy in materials characterization
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