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FFPE - Thin film electronic properties, semiconductor interfaces
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FFPE - Thin film electronic properties, semiconductor interfaces
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1
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
Wang, Yuhan
2021
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transmission
electron
microscopy
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2
E-Book
Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /
Wang, Yuhan
2021
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...
transmission
electron
microscopy
...
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Beurteilung der optischen Eigenschaften von AlGaInP hergestellt in der metallorganischen Gasphasenepitaxie unter Stickstoff- oder Wasserstoffatmosphäre [E-Book] /
Schmidt, Roland
1998
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Kompositionelle und strukturelle Charakterisierung von verspannten Si/SiGe-Heterostrukturen mit hochauflösender Transmissionselektronenmikroskopie [E-Book] /
Stenkamp, Dirk
1993
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5
Book
TEM/TED studies of epitaxial layers of ternary and quaternary group III-V compound semiconductor alloys.
Norman, A. G.
1987
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Available as
Electronic Edition
3
Print Edition
2
Material Type
Book
5
Type of Literature
Theses
4
Report
1
Year of Publication
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Location
ZB
5
Name
Wang, Yuhan
2
Norman, A. G.
1
Schmidt, Roland
1
Stenkamp, Dirk
1
Subject
transmission electron microscopy
5
III - V semiconductor
4
semiconductor heterostructure
4
heterojunction
2
holography
2
nitride
2
more ...
scanning tunneling microscopy
2
electron diffraction
1
optical properties
1
photoluminescence
1
semiconducting film
1
strained layer
1
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJKC - III - V semiconductors
2
FJL - Physics of solid state devices
2
FGK - Thin film technology, epitaxy
1
FHGB - Conventional electron microscopy
1
FHGE - Electron diffraction
1
more ...
FHGJ - High resolution and high voltage electron microscopy
1
FJKB - Elemental semiconductors
1
FJNC - Optical spectroscopy in solids
1
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Language
English
2
German
2
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