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Williams, David B.
13
Carter, C. Barry
9
Carter, C. Barry.
4
Goodhew, Peter J.
4
Reimer, L.
4
Hawkes, Peter W.
3
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Anderson, Ron M.
2
Bhatnagar-Schöffmann, Tanvi
2
Bornhöfft, Manuel
2
Borsali, Redouane
2
Caron, Jan
2
Chescoe, D.
2
Fultz, Brent
2
Gemming, Thomas
2
Hornbogen, Erhard
2
Howe, James
2
Josten, Elisabeth
2
Kirkland, Earl J.
2
Klomparens, Karen L.
2
Kohl, H.
2
Rayaprolu, Rahul
2
Skrotzki, Birgit
2
Spudat, Christian
2
Thomas, Jürgen
2
Wang, Yuhan
2
Weßels, Teresa
2
Winkler, Florian
2
Zhang, Xiao-Feng
2
Anderson, Ronald M.
1
Argon, Ali Suphi
1
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transmission electron microscopy
105
scanning electron microscopy
21
electron microscopy
15
materials characterization
15
electron diffraction
13
diffraction
9
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scanning transmission electron microscopy
9
Transmission electron microscopy.
8
electron optics
8
holography
8
imaging technique
8
sample preparation
8
III - V semiconductor
7
STEM [scanning transmission electron microscopy)
7
metallography
7
scattering
7
X-ray diffraction
5
electron source
5
nanostructures
5
optical microscopy
5
electron microprobe analysis
4
high resolution
4
magnetism
4
microscopy
4
scanning tunneling microscopy
4
semiconductor heterostructure
4
Auger electron spectroscopy
3
SIMS (secondary ion mass spectroscopy)
3
X-ray microanalysis
3
crystal defect
3
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FHG - Electron microscopy
41
FHGB - Conventional electron microscopy
22
FHJ - Scanning electron microscopy, analytical electron microscopy
16
FHE - Imaging methods in materials characterization
9
FHA - Materials characterization - general aspects
7
FMGH - Metallographic microscopy, metallographic stereology
7
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FKC - Magnetism - specific aspects
6
FFPE - Thin film electronic properties, semiconductor interfaces
5
FNPE - Nanostructured materials
5
FAF - Materials research - comprehensive works
4
FGN - Nanotechnology
3
FHGJ - High resolution and high voltage electron microscopy
3
FHJC - Microbeam analysis
3
FJHE - Defects and radiation effects in semiconductors
3
FJKC - III - V semiconductors
3
LRH - Cytology - methods
3
PED - Particle radiation, particle optics
3
DPA - Electronic data processing - applications
2
DYK - Image processing
2
FDCD - Dislocations
2
FEA - Cooperative phenomena
2
FECB - Phase transitions
2
FFGC - Electron spectroscopy
2
FGG - Ion beam technology
2
FGK - Thin film technology, epitaxy
2
FHCH - Microstructural analysis
2
FHL - Synchrotron radiation techniques
2
FHN - Neutron scattering
2
FJL - Physics of solid state devices
2
FNX - Carbon, carbon materials
2
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