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Scanning tunneling potentiometry at nanoscale defects in thin films /
Lüpke
,
Felix
2018
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Lüpke
,
Felix
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke
,
Felix
2018
Other Personal Name(s):
“
...
Lüpke
,
Felix
...
”
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Name
Lüpke, Felix
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Subject
defect analysis
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insulator
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scanning tunneling microscopy
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thin film
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FHEG - Tunneling microscopy, force microscopy
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English
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