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Strukturelle Charakterisierung von Grenzflächen und Korngrenzen in CVD-Diamantfilmen auf Silizium-Substraten mittels hochauflösender Verfahren der Transmissionselektronenmikroskopi...
Wittorf
,
Dirk
1999
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Wittorf
,
Dirk
...
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2
Book
Untersuchung der bei der Eindiffusion von Zn in InP entstehenden Gitterfehlordnung.
Wittorf
,
Dirk
.
1994
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Wittorf
,
Dirk
....
”
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ZB
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Name
Wittorf, Dirk
1
Wittorf, Dirk.
1
Subject
III - V semiconductor
1
diamond film
1
impurity diffusion
1
transmission electron microscopy
1
Classification
FHAB - Surface and thin film characterization
1
FHGJ - High resolution and high voltage electron microscopy
1
FJHE - Defects and radiation effects in semiconductors
1
FJKC - III - V semiconductors
1
Language
German
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