1
Chemical surface preparation, passivation and cleaning for semiconductor growth and processing: symposium : San-Francisco, CA, 27.04.92-29.04.92.
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Comparison of thin film transistor and soi technologies : Symposium : Materials Research Society: spring meeting. 0001 : Albuquerque, NM, 26.02.1984-28.02.1984.
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Lam, H. W.
1984
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Electrical characterization of silicon-on-insulator materials and devices /
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Festkörperforschung für die Informationstechnik : Vorlesungsmanuskripte des 21. IFF-Ferienkurses vom 5. bis 16. März 1990 im Forschungszentrum Jülich /
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Festkörperforschung für die Informationstechnik : Vorlesungsmanuskripte des 21. IFF-Ferienkurses vom 5. bis 16. März 1990 im Forschungszentrum Jülich [E-Book] /

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III-V electronic and photonic device fabrication and performance: symposium: papers : San-Francisco, CA, 12.04.93-15.04.93.
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Materials Research Society: fall meeting. 1986 : Science and technology of microfabrication: symposium : Boston, MA, 04.12.1986-05.12.1986.
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Processing of semiconductors.
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Semiconductor on insulator and thin film transistor technology: symposium : Boston, MA, 03.12.85-06.12.85.
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Chiang, A.
1986
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Surface chemical cleaning and passivation for semiconductor processing : symposium held April 13-15, 1993, San Francisco, California USA : [during the 1993 spring meeting] /
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