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FAF - Materials research - comprehensive works
Book
IEK-5
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IEK-5
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1
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Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A. /
Kanicki, Jerzy
1993
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2
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Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A. /
Biegelsen, D. K.
1993
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3
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Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A. /
Dow, J. D.
1987
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4
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Layered structures and epitaxy. 1985 : Materials Research Society annual meeting : Boston, MA, 02.12.1985-04.12.1985.
Gibson, J. M.
1986
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5
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Materials characterization : symposium held April 15-17, 1986, Palo-Alto, California, U.S.A. /
Cheung, N.
1986
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6
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Materials issues in amorphous-semiconductor technology : symposium held April 15-18, 1986, Palo-Alto, California, U.S.A. /
Adler, David
1986
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7
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Microcrystalline semiconductors : materials science and devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A. /
Fauchet, P. M.
1993
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Thin films and interfaces. 2, 1983 : Materials Research Society annual meeting : Boston, MA, 14.11.1983-18.11.1983 /
Baglin, John E.
1984
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9
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Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting : November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A. /
Ho, P. S.
1982
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Available as
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9
Material Type
Book
Type of Literature
Conference Publication
9
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IEK-5
ZB
9
IEK-4
1
Name
Adler, David
1
Baglin, John E.
1
Biegelsen, D. K.
1
Campbell, D. R.
1
Cheung, N.
1
Chu, Wei-Kan
1
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Dow, J. D.
1
Fauchet, P. M.
1
Gibson, J. M.
1
Hamakawa, Yoshihiro
1
Ho, P. S.
1
Kanicki, Jerzy
1
Madan, Arun
1
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Subject
materials characterization
2
amorphous material
1
amorphous semiconductor
1
dielectric film
1
electroluminescence
1
germanium
1
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imaging technique
1
interface
1
nanostructures
1
porous silicon
1
quantum dot
1
quantum well
1
quantum wire
1
silicon
1
surface
1
thin film
1
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Classification
FAF - Materials research - comprehensive works
FFP - Physics of thin films
3
FFPE - Thin film electronic properties, semiconductor interfaces
2
FFPG - Multilayer systems, quantum structures
2
FJEC - Amorphous semiconductors
2
FGK - Thin film technology, epitaxy
1
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FHA - Materials characterization - general aspects
1
FHE - Imaging methods in materials characterization
1
FJBC - Dielectric materials
1
FJKB - Elemental semiconductors
1
FJNH - Excited states in solids
1
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Language
English
2
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