1
Experimental techniques of texture analysis : Proceedings of a workshop : Clausthal-Zellerfeld, 25.03.85-29.03.85.
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Fundamentals of beam solid interactions and transient thermal processing: symposium : Boston, MA, 30.11.87-03.12.87 /
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International Electron Devices Meeting. 1999 : IEDM : technical digest : Washington, DC, December 5-8, 1999 /
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1999
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Molecular beam epitaxy and heterostructures : Nato Advanced Study Institute on Molecular Beam Epitaxy (mbe) and Heterostructures: proceedings : Erice, 07.03.1983-19.03.1983.
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Nanopatterning - from ultralarge-scale integration to biotechnology : symposium held November 25-29, 2001, Boston, Massachusetts, USA [at the 2001 MRS fall meeting] /
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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
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Semiconductor interfaces : formation and properties : International winter school on semiconductor interfaces : formation and properties: workshop, proceedings : Les-Houches, 24.02.87-06.03.87.
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Lelay, G.
1987
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Substrate engineering : paving the way to epitaxy : symposium held November 29 - December, 3, 1999, Boston, Massachusetts, USA [MRS fall meeting 1999] /
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9
Superconducting electronics : NATO advanced study institute on superconducting electronics: proceedings : Castelvecchio-Pascoli, 26.06.88-08.07.88.
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Theoretical methods of texture analysis /
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