Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Electronic Edition
FFPE - Thin film electronic properties, semiconductor interfaces
AND
FJNC - Optical spectroscopy in solids
Reset Filters
Show filters (3)
Electronic Edition
FFPE - Thin film electronic properties, semiconductor interfaces
AND
FJNC - Optical spectroscopy in solids
Ask a Librarian
Books & more
: Hits
1 - 3
of
3
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Beurteilung der optischen Eigenschaften von AlGaInP hergestellt in der metallorganischen Gasphasenepitaxie unter Stickstoff- oder Wasserstoffatmosphäre [E-Book] /
Schmidt, Roland
1998
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 2
2
E-Book
Charakterisierung gestörter und nanokristalliner Halbleiterschichten mittels inelastischer Lichtstreuung [E-Book] /
Berger, Michael G.
1992
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Nichtlineare optische Spektroskopie an Grenzflächen [E-Book] /
Krause, Hans-Joachim
1993
Full text
JuSER
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Electronic Edition
Material Type
Book
3
Type of Literature
Theses
2
Report
1
Year of Publication
From:
To:
Location
ZB
3
Name
Berger, Michael G.
1
Krause, Hans-Joachim
1
Schmidt, Roland
1
Subject
semiconductor interface
2
III - V semiconductor
1
Raman spectroscopy
1
light scattering
1
multilayer system
1
optical properties
1
more ...
photoluminescence
1
picosecond spectroscopy
1
semiconductor heterostructure
1
transmission electron microscopy
1
see all ...
less ...
Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJNC - Optical spectroscopy in solids
CUME - Picosecond phenomena
1
FGK - Thin film technology, epitaxy
1
FJKC - III - V semiconductors
1
Language
German
3
/* End Narrow Search Options */ ?>
×
Loading...