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FFPE - Thin film electronic properties, semiconductor interfaces
transmission electron microscopy
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Electronic Edition
FFPE - Thin film electronic properties, semiconductor interfaces
transmission electron microscopy
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1
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Beurteilung der optischen Eigenschaften von AlGaInP hergestellt in der metallorganischen Gasphasenepitaxie unter Stickstoff- oder Wasserstoffatmosphäre [E-Book] /
Schmidt, Roland
1998
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Kompositionelle und strukturelle Charakterisierung von verspannten Si/SiGe-Heterostrukturen mit hochauflösender Transmissionselektronenmikroskopie [E-Book] /
Stenkamp, Dirk
1993
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /
Wang, Yuhan
2021
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Available as
Electronic Edition
Material Type
Book
3
Type of Literature
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2
Report
1
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ZB
3
Name
Schmidt, Roland
1
Stenkamp, Dirk
1
Wang, Yuhan
1
Subject
semiconductor heterostructure
3
transmission electron microscopy
III - V semiconductor
2
heterojunction
1
holography
1
nitride
1
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optical properties
1
photoluminescence
1
scanning tunneling microscopy
1
strained layer
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FGK - Thin film technology, epitaxy
1
FHGJ - High resolution and high voltage electron microscopy
1
FJKB - Elemental semiconductors
1
FJKC - III - V semiconductors
1
FJL - Physics of solid state devices
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FJNC - Optical spectroscopy in solids
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German
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English
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