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FFPE - Thin film electronic properties, semiconductor interfaces
Wang, Yuhan
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Theses
FFPE - Thin film electronic properties, semiconductor interfaces
Wang, Yuhan
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
Wang, Yuhan
2021
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /
Wang, Yuhan
2021
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ZB
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Name
Wang, Yuhan
Subject
III - V semiconductor
2
heterojunction
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holography
2
nitride
2
scanning tunneling microscopy
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semiconductor heterostructure
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transmission electron microscopy
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJL - Physics of solid state devices
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English
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