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1

Charakterisierung gestörter und nanokristalliner Halbleiterschichten mittels inelastischer Lichtstreuung [E-Book] /

E-Book

Charakterisierung gestörter und nanokristalliner Halbleiterschichten mittels inelastischer Lichtstreuung [E-Book] /

Berger, Michael G.
1992

Full text JuSER

2

Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /

Book

Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /

Flatten, Tim
2020

Table of Contents

3

Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /

E-Book

Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /

Flatten, Tim
2020

Full text JuSER

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