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FFPE - Thin film electronic properties, semiconductor interfaces
strained layer
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FFPE - Thin film electronic properties, semiconductor interfaces
strained layer
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Bandoffsets an Grenzflächen von hochverspannten III-V Halbleitern [E-Book] /
Ohler, Christian
1997
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Kompositionelle und strukturelle Charakterisierung von verspannten Si/SiGe-Heterostrukturen mit hochauflösender Transmissionselektronenmikroskopie [E-Book] /
Stenkamp, Dirk
1993
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2
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ZB
2
Name
Ohler, Christian
1
Stenkamp, Dirk
1
Subject
semiconductor heterostructure
2
strained layer
III - V semiconductor
1
photoelectron spectroscopy
1
transmission electron microscopy
1
Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FHGJ - High resolution and high voltage electron microscopy
1
FJHB - Band structure and electronic transport in semiconductors
1
FJKB - Elemental semiconductors
1
FJKC - III - V semiconductors
1
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English
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German
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