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FHAB - Surface and thin film characterization
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FCD - Crystal physics
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FHAB - Surface and thin film characterization
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FCD - Crystal physics
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1
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie [E-Book] /
Fink, Thomas
2018
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Morphologie und Energetik kleiner Bleikristalle untersucht mit Rastertunnel- und Rasterelektronenmikroskopie [E-Book] /
Emundts, Arndt
2001
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...
Michard, Stephan Yann
2015
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...
Michard, Stephan Yann
2015
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Available as
Electronic Edition
3
Print Edition
2
Material Type
Book
5
Type of Literature
Theses
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ZB
5
Name
Fink, Thomas
2
Michard, Stephan Yann
2
Emundts, Arndt
1
Subject
silicon
4
thin film
4
chemical vapor deposition
2
crystal growth
2
crystal structure analysis
2
deposition
2
more ...
materials characterization
2
microtechnology
2
raman spectroscopy
2
silicon solar cell
2
scanning electron microscopy
1
scanning tunneling microscopy
1
surface energy
1
surface structure
1
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Classification
FCD - Crystal physics
FHAB - Surface and thin film characterization
FCBH - Crystal structure of specific substances
4
CUSE - Raman spectroscopy
2
EISF - Thin film solar cells
2
FCA - Crystallography
2
more ...
FHEG - Tunneling microscopy, force microscopy
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
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Language
German
3
English
2
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