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FHAB - Surface and thin film characterization
III - V semiconductor
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FHAB - Surface and thin film characterization
III - V semiconductor
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Entwicklung eines Rastertunnelmikroskops in Kombination mit einer Anlage zur Molekularstrahlepitaxie und Photoemissionsspektroskopie [E-Book]/
Daniels, Claudia
2000
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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /
Schwartzkopff, Michael.
1999
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ZB
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Name
Daniels, Claudia
1
Schwartzkopff, Michael.
1
Subject
III - V semiconductor
scanning tunneling microscopy
2
luminescence
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molecular beam epitaxy
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photoelectron spectroscopy
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semiconductor surface
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surface analysis
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Classification
FHAB - Surface and thin film characterization
FHEG - Tunneling microscopy, force microscopy
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FJKC - III - V semiconductors
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German
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