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FHEG - Tunneling microscopy, force microscopy
Kann, Gunther H.
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Theses
FHEG - Tunneling microscopy, force microscopy
Kann, Gunther H.
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E-Book
Rastertunnelmikroskopie und -spektroskopie an deponierten Einzelfullerenen : C60, Ce@C60 und La@C60 [E-Book] /
Kann, Gunther H.
2000
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Name
Kann, Gunther H.
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electronic properties
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fullerenes
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scanning tunneling microscopy
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Classification
FHEG - Tunneling microscopy, force microscopy
FNX - Carbon, carbon materials
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German
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