Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Theses
FHEG - Tunneling microscopy, force microscopy
AND
FJKB - Elemental semiconductors
ZB
Reset Filters
Show filters (4)
Theses
FHEG - Tunneling microscopy, force microscopy
AND
FJKB - Elemental semiconductors
ZB
Ask a Librarian
Books & more
: Hits
1 - 2
of
2
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Untersuchungen des Wachstums und der Struktur von Siliziden mittels Rastertunnelmikroskopie und Rastertunnelspektroskopie [E-Book] /
Raunau, Werner
1993
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Untersuchungen zum Stossionisationsdurchbruch in p-Germanium mit einem Tieftemperatur-Rastertunnelmikroskop /
Muz, Christof.
1998
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
1
Print Edition
1
Material Type
Book
2
Type of Literature
Theses
Year of Publication
From:
To:
Location
ZB
Name
Muz, Christof.
1
Raunau, Werner
1
Subject
scanning tunneling microscopy
2
epitaxy
1
germanium
1
low temperature
1
silicide
1
Classification
FHEG - Tunneling microscopy, force microscopy
FJKB - Elemental semiconductors
FGML - Characterization of electronic materials
1
Language
German
1
×
Loading...
