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FHEG - Tunneling microscopy, force microscopy
ZB
defect analysis
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Theses
FHEG - Tunneling microscopy, force microscopy
ZB
defect analysis
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Scanning tunneling potentiometry at nanoscale defects in thin films /
Lüpke, Felix
2018
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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Untersuchung von Defekten auf einer gestuften Silber(111)-Fläche mit einem Tieftemperatur- Rastertunnelmikroskop und hochauflösender Elektronenbeugung [E-Book] /
Wolf, J. Franciscus
1990
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ZB
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Lüpke, Felix
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Wolf, J. Franciscus
1
Subject
defect analysis
scanning tunneling microscopy
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insulator
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thin film
2
electron diffraction
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silver
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FHEG - Tunneling microscopy, force microscopy
FDCH - Defects in metals
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FFJ - Surface structure, gas solid interface
1
FHGE - Electron diffraction
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English
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German
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