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FHEG - Tunneling microscopy, force microscopy
Print Edition
Schwartzkopff, Michael.
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Theses
FHEG - Tunneling microscopy, force microscopy
Print Edition
Schwartzkopff, Michael.
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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /
Schwartzkopff, Michael.
1999
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Schwartzkopff, Michael.
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III - V semiconductor
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luminescence
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scanning tunneling microscopy
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semiconductor surface
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FHAB - Surface and thin film characterization
1
FHEG - Tunneling microscopy, force microscopy
FJKC - III - V semiconductors
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