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FHEG - Tunneling microscopy, force microscopy
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insulator
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Theses
FHEG - Tunneling microscopy, force microscopy
Print Edition
insulator
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Scanning tunneling potentiometry at nanoscale defects in thin films /
Lüpke, Felix
2018
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Lüpke, Felix
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defect analysis
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insulator
scanning tunneling microscopy
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thin film
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FHEG - Tunneling microscopy, force microscopy
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