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FHEG - Tunneling microscopy, force microscopy
charge transport
Print Edition
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Theses
FHEG - Tunneling microscopy, force microscopy
charge transport
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1
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Ladungstransport durch Graphenschichten und GaAs-Nanodrähte untersucht mit einem Multispitzen-Rastertunnelmikroskop /
Korte, Stefan
2014
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Ladungstransportmessungen an Si(111) Oberflächen mit einem Multispitzen-Rastertunnelmikroskop /
Blab, Marcus
2014
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ZB
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Name
Blab, Marcus
1
Korte, Stefan
1
Subject
charge transport
scanning tunneling microscopy
2
graphene
1
Classification
FHA - Materials characterization - general aspects
2
FHE - Imaging methods in materials characterization
2
FHEG - Tunneling microscopy, force microscopy
FNX - Carbon, carbon materials
1
Language
German
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