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FHEG - Tunneling microscopy, force microscopy
defect
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FHEG - Tunneling microscopy, force microscopy
defect
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Rastertunnelmikroskopieuntersuchungen bei tiefen Temperaturen : die Defektmorphologie einzelner Ioneneinschüsse und Phasenumwandlungen der zweidimensionalen Eisdoppellage auf Pt(11...
Morgenstern, Markus
1996
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Untersuchung der Kristallgitterdefekte und der Kompensationsmechanismen in hoch siliziumdotiertem GaAs mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Domke, Christiane
1998
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2
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Book
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ZB
2
Name
Domke, Christiane
1
Morgenstern, Markus
1
Subject
defect
scanning tunneling microscopy
2
gallium arsenide
1
ice
1
low temperature
1
morphology
1
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phase transition
1
platinum
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silicon
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Classification
FHEG - Tunneling microscopy, force microscopy
FJHE - Defects and radiation effects in semiconductors
1
Language
German
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