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FJKC - III - V semiconductors

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FJKC - III - V semiconductors

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Books & more: Hits 1 - 20 of 35

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Bandoffsets an Grenzflächen von hochverspannten III-V Halbleitern [E-Book] /

Ohler, Christian
1997

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Bivalente Störstellen in Silizium, Germanium und Galliumarsenid.

Roos, G.
1990

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Elektrische Transporteigenschaften von niedrigdimensionalen verspannten Gallium Indium Arsenid/Indiumphosphid Heterostrukturen [E-Book] /

Loeken-Larsen, Hilde
1991

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Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /

Luysberg, Martina
1993

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Elektronenmikroskopische Untersuchungen von Gitterbaufehlern in Galliumarsenid [E-Book] /

Schloßmacher, Peter
1991

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Entwicklung einer Galliumarsenid-Einkristallziehapparatur nach dem Heiß-Wand-Czochralski Verfahren [E-Book] /

Karagiannakos, Konstantinos
1992

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GaAs- Einkristallzucht mit totaler Flüssigeinkapselung im vertikalen Bridgman Verfahren [E-Book] /

Naeven, Ralf
1993

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GaAs-Kristallzucht unter Stöchiometriekontrolle [E-Book] /

Dahlen, Achim
1993

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GaN/Al(Ga)N heterostructures : MBE growth, electronic properties and polarization fields [E-Book] /

Lantier, Roberta
2000

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Herstellung und Charakterisierung von Detektoren im Materialsystem AlGaAs/GaAs [E-Book] /

Lauter, Josef
1993

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Interdiffusion von Heterostrukturen auf Antimonidbasis [E-Book] /

Jahnen, Burkhard
2002

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Laterale Elektronen Supergitter auf Galliumarsenid.

Lorke, A. H.
1991

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Mechanismen der Desorption und Entmischung auf Indiumphosphid (110)-Oberflächen bei thermischer Behandlung [E-Book] /

Heinrich, Marcus
1997

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Metallorganische Molekularstrahlepitaxie von InP auf GaAs-Substraten für die Herstellung metamorpher Hochfrequenztransistoren [E-Book] /

Schmidt, Roland
2001

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MOVPE von (AlGaIn)P unter dem Trägergas Stickstoff für LED-Strukturen [E-Book] /

Gauer, Dorothea
2001

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Optische Spektroskopie und Röntgenbeugung an Fehlstellen in Galliumarsenid nach Tieftemperatur-Elektronenbestrahlung [E-Book] /

Pillukat, Alexander
1991

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Photolumineszenzmessungen an MBE- Aluminiumgalliumarsenide/Galliumarsenide- Halbleiterschichtsystemen zur Optimierung der Wachstumsparameter [E-Book] /

Kubon, Marcus
1991

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Pseudomorphe Indium Gallium Arsenid/Gallium(Aluminium)Arsenid Heterostrukturen: Wachstum und Charakterisierung.

Reithmaier, J. P.
1990

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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /

Ebert, Philipp
1993

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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /

Schwartzkopff, Michael.
1999

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Electronic Edition 25 Print Edition 10

Book 35

Theses

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To:

Mörsch, Georg 2 Weidlich, Phillip H. 2 Appenzeller, Jörg 1 Cox, Gerhard 1 Dahlen, Achim 1 Das, Biswajit. 1 more ... Ebert, Philipp 1 Gauer, Dorothea 1 Gebhardt, Roman 1 Heinrich, Marcus 1 Hollfelder, Martin 1 Jahnen, Burkhard 1 Karagiannakos, Konstantinos 1 Kubon, Marcus 1 Lantier, Roberta 1 Lauter, Josef 1 Leuther, Arnulf 1 Loeken-Larsen, Hilde 1 Lorke, A. H. 1 Luysberg, Martina 1 Mihopoulos, Theodoros. 1 Naeven, Ralf 1 Norman, A. G. 1 Ohler, Christian 1 Otte, Martin 1 Pillukat, Alexander 1 Reithmaier, J. P. 1 Richter, J. 1 Roos, G. 1 Schloßmacher, Peter 1 see all ... less ...

gallium arsenide 17 III - V semiconductor 14 semiconductor heterostructure 8 molecular beam epitaxy 4 scanning tunneling microscopy 4 crystal defect 2 more ... crystal growth 2 defect analysis 2 dislocation 2 electronic transport 2 epitaxy 2 gallium 2 heterostructure 2 nitride 2 semiconductor 2 silicon 2 transmission electron microscopy 2 Bridgman method 1 Czochralski method 1 Hall effect 1 X-ray diffraction 1 band structure 1 chemical vapor deposition 1 crystal growth from melt 1 crystal optics 1 defect structure 1 desorption 1 diffusion 1 electron diffraction 1 electron energy loss spectroscopy 1 see all ... less ...

FJKC - III - V semiconductors FJHE - Defects and radiation effects in semiconductors 9 FFPG - Multilayer systems, quantum structures 7 FFPE - Thin film electronic properties, semiconductor interfaces 5 FGK - Thin film technology, epitaxy 4 FHEG - Tunneling microscopy, force microscopy 4 more ... FGCD - Crystal growth of specific substances 3 FGKC - Vacuum deposition, MBE 3 FGKF - Chemical vapor deposition 2 FHAB - Surface and thin film characterization 2 FHCF - Defect characterization 2 FHGB - Conventional electron microscopy 2 FJCK - Electrical conduction in solid materials 2 FJHB - Band structure and electronic transport in semiconductors 2 FJP - Optical materials, crystal optics 2 FDCD - Dislocations 1 FDKB - Diffusion in condensed matter 1 FFGC - Electron spectroscopy 1 FFJ - Surface structure, gas solid interface 1 FGC - Crystal growth, crystal technology 1 FHCB - X-ray scattering 1 FHCD - Small angle scattering 1 FHGE - Electron diffraction 1 FJKB - Elemental semiconductors 1 FJL - Physics of solid state devices 1 FJLB - Physics of semiconductor devices 1 FJNE - Active centers in solids 1 FPGB - Plastic deformation 1 TBF - Semiconductor devices 1 see all ... less ...

German 22 English 4

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