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scanning tunneling microscopy
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defect analysis
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scanning tunneling microscopy
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defect analysis
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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Untersuchung von Defekten auf einer gestuften Silber(111)-Fläche mit einem Tieftemperatur- Rastertunnelmikroskop und hochauflösender Elektronenbeugung [E-Book] /
Wolf, J. Franciscus
1990
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Name
Lüpke, Felix
1
Wolf, J. Franciscus
1
Subject
defect analysis
scanning tunneling microscopy
electron diffraction
1
insulator
1
silver
1
thin film
1
Classification
FHEG - Tunneling microscopy, force microscopy
2
FDCH - Defects in metals
1
FFJ - Surface structure, gas solid interface
1
FHGE - Electron diffraction
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English
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German
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