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1
Book
Analysis and simulation of semiconductor devices /
Selberherr, Siegfried
2013
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2
Book
Atom probe tomography : analysis at the atomic level /
Miller, Michael Kenneth
2000
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3
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Autodesk Inventor : Trainingshandbuch ; Aufbau . 2021
2020
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4
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Autodesk Inventor : Trainingshandbuch ; Grundlagen . 2021
2020
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5
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Ernst Ruska [Kunstwerk] /
by
Noack, Hermann
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Erscheinungen [Kunstwerk] /
by
Bosch, Bettina
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7
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Inventor 2012 : das Anwenderbuch 2 : Baugruppenkonstruktion, 2D-Zeichnung-Ansichten platzieren, 2D-Zeichnung-mit Anmerkung versehen, Datenmanagement /
Lang, Richard
2011
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8
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Inventor 2012 : das Anwenderbuch 1 : Grundsätzliches, Grundkurs Bauteilkonstruktion, Bauteilkonstruktion 2D Skizzierbefehle, Bauteilkonstruktion 3D Befehlsreferenz /
Lang, Richard
2011
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9
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Materialwissenschaften und Werkstofftechnik : eine Einführung /
Callister, William D. Jr.
2013
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10
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Aberration-corrected analytical transmission electron microscopy /
Brydson, Rik
2011
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11
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Scanning transmission electron microscopy : imaging and analysis /
Pennycook, Stephen J.
2011
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12
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Topology optimization : theory, methods and applications /
Bendsøe, Martin P.
2004
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13
Book
Transmission electron microscopy : a textbook for materials science /
Williams, David B.
2009
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Available as
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11
Material Type
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11
Artwork
2
Type of Literature
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5
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PGI-5
ER-C-1
2
IEK-5
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P-Z
2
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Name
Lang, Richard
2
Bendsøe, Martin P.
1
Bosch, Bettina
1
Brydson, Rik
1
Callister, William D. Jr.
1
Carter, C. Barry
1
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Miller, Michael Kenneth
1
Noack, Hermann
1
Pennycook, Stephen J.
1
Rethwisch, David G.
1
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1
Selberherr, Siegfried
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4
transmission electron microscopy
3
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computer aided design
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atom probe field ion microscopy
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drawing
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instruction
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mass spectrometer
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materials
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materials characterization
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semiconductor device
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Classification
THE - Computer aided design and engineering (CAD)
4
FHG - Electron microscopy
2
FAH - Materials research - general aspects
1
FFGH - Electron emission, field emission
1
FHE - Imaging methods in materials characterization
1
FHJ - Scanning electron microscopy, analytical electron microscopy
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German
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