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Besmehn, A.
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Bourdelle, K.K.
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Schubert, Jürgen
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Zhao, Q. T.
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Besmehn, A.
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Zhao, Q. T.
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Contribution to a book
Electrical characterization of TbScO3/TiN gate stacks in MOS capacitors and MOSFETs on strained and unstrained SOI
Durgun Özben, E.
2010
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Besmehn, A.
Bourdelle, K.K.
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Grundlagen für zukünftige Informationstechnologien
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Halbleiter-Nanoelektronik; IBN-1
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Zentralabteilung für Chemische Analysen; ZCH
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