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Besmehn, A.
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Scholl, A.
Zentralabteilung für Chemische Analysen; ZCH
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Besmehn, A.
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Scholl, A.
Zentralabteilung für Chemische Analysen; ZCH
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1
Journal Article
Castellated structures for ITER: the influence of the shape of castellation on the impurity deposition and fuel accumulation in gaps
Litnovsky, A.
2007
Physica scripta, T128 (2007) S. 45 - 49
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2
Poster
TOF-SIMS studies on Rose Bengal devices: Search for the mechanism responsible for resistive switching
Besmehn, A.
2005
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3
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Characterization of layers and interfaces during the silicide formation of CoSix and NiSiy
Breuer, U.
2005
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4
Journal Article
Surface characterisation and interface studies of high-k materials by XPS and TOF-SIMS
Besmehn, A.
2005
Applied surface science, 252 (2005) S. 172 - 176
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5
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Surface Characterisation and Interface Studies of high-k Materials with XPS and TOF-SIMS
Besmehn, A.
2004
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6
Conference Presentation
Oberflächenanalytik in der Forschung - Applikationen und künftige Herausforderungen
Scholl, A.
2003
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6
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Poster
3
Journal Article
2
Conference Presentation
1
Name
Besmehn, A.
Breuer, U.
6
Scholl, A.
Rije, E.
3
Alba, M.
1
Droste, A.
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Karthäuser, Silvia
1
Kirschner, Andreas
1
Kreter, Arkadi
1
Krieger, K.
1
Küppers, Stephan
1
Litnovsky, Andrey
1
Lüssem, B.
1
Mertens, Ph.
1
Philipps, V.
1
Richter, S.
1
Samm, Ulrich
1
Schmitz, O.
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Sergienko, Gennady
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Wienhold, P.
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Xu, Y.
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Zhang, M.
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Zhao, Q.
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Research Program
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
5
Fusion
1
Contributing Institute
Zentralabteilung für Chemische Analysen; ZCH
Institut für Halbleiterschichten und Bauelemente; ISG-1
3
Elektronische Materialien; IFF-IEM
1
JARA-ENERGY; JARA-ENERGY
1
Plasmaphysik; IEF-4
1
Scientific Report
2005
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2003
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