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Breuer, U.
Zentralabteilung für Chemische Analysen; ZCH
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Breuer, U.
Zentralabteilung für Chemische Analysen; ZCH
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1
Journal Article
Inhomogeneous Local Conductivity Induced by Thermal Reduction in BaTiO3 Thin Films and Single Crystals
Reichenberg, B.
2004
Integrated ferroelectrics, 61 (2004) S. 43 - 49
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2
Poster
Characterization of Pt/LaAlO3 Gate Stacks on Si(100)
Rije, E.
2004
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3
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Surface Characterisation and Interface Studies of high-k Materials with XPS and TOF-SIMS
Besmehn, A.
2004
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4
Journal Article
Silicon-based electrically driven microcavity LED
Potfajova, J.
2004
Electronics letters, 40 (2004) S. 904 - 906
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4
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Journal Article
2
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Breuer, U.
Besmehn, A.
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Mantl, S.
2
Rije, E.
2
Dekorsy, T.
1
Heeg, T.
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Helm, M.
1
Houben, L.
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Lenk, Steffi
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Luysberg, Martina
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Potfajova, J.
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Reichenberg, B.
1
Schmidt, B.
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Schneller, T.
1
Scholl, A.
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Schubert, Jürgen
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Skorupa, W.
1
Sun, J. M.
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Szot, K.
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Tiedke, S.
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Waser, R.
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Winnerl, S.
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Zhao, Q. T.
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Research Program
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
4
Contributing Institute
Zentralabteilung für Chemische Analysen; ZCH
Institut für Halbleiterschichten und Bauelemente; ISG-1
3
Center of Nanoelectronic Systems for Information Technology; CNI
1
Elektronische Eigenschaften; IFF-IEE
1
Elektronische Materialien; IFF-IEM
1
Scientific Report
2004
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