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Cojocaru-Mirédin, Oana
Open Access
Materialwissenschaft u. Werkstofftechnik; ER-C-2
Controlling Configuration-Based Phenomena
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Cojocaru-Mirédin, Oana
Open Access
Materialwissenschaft u. Werkstofftechnik; ER-C-2
Controlling Configuration-Based Phenomena
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Journal Article
Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
Stoffers, Andreas
2017
Microscopy and microanalysis, 23 (2017) 02, S. 291 - 299
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Barthel, Juri
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Cojocaru-Mirédin, Oana
Gault, Baptiste
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Research Program
Controlling Configuration-Based Phenomena
Contributing Institute
Materialwissenschaft u. Werkstofftechnik; ER-C-2
Scientific Report
2017
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