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Cramm, Stefan
Elektronische Eigenschaften; IFF-9
Poster
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Cramm, Stefan
Elektronische Eigenschaften; IFF-9
Poster
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Select result number 1
1
Poster
Coupled magnetic multilayer systems studied by resonant reflectivity in the XUV range
GRYCHTOL, P.
2010
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2
Poster
Commissioning of the new aberration-corrected, energy-filtered PEEM/LEEM endstation at BESSY
Nickel, F.
2010
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3
Poster
Commissioning of the new aberration-corrected energy-filtered PEEM/LEEM endstation at BESSY
Nickel, F.
2010
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4
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Spatially resolved magnetization dynamics of individual layers in interlayer exchange coupled trilayer systems
Kaiser, A.
2010
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5
Poster
Layer-resolved magnetization dynamics in interlayer exchange coupled trilayers
Kaiser, A.
2009
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6
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Slow and fast excitation of magnetization dynamics in interlayer coupled heterostructures
Kaiser, A.
2009
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7
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Gated detector for time-resolved photoemission microscopy
Wiemann, C.
2008
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8
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Time-resolved PEEM measurements on single-crystalline Fe-structures
Kaiser, A.
2008
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9
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Gated detector for time-resolved photoemission microscopy
Kaiser, A.
2007
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10
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Magnetism and magnetic microstructure in Heusler alloy based thin film systems
Kaiser, A.
2007
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10
Document Type
Poster
Name
Cramm, Stefan
Schneider, Claus Michael
10
Kaiser, A.
9
Wiemann, C.
8
Berghaus, A.
2
Krug, I.
2
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Nickel, F.
2
Pfeifer, H.
2
Schaff, O.
2
Tieg, C.
2
ADAM, R.
1
Bürgler, Daniel
1
GRYCHTOL, P.
1
Quesada, A.
1
Quesada, O.
1
Rata, D.
1
Schmid, A.K.
1
Schmidt, A.K.
1
VALENCIA, S.
1
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Research Program
Grundlagen für zukünftige Informationstechnologien
10
Contributing Institute
Elektronische Eigenschaften; IFF-9
Scientific Report
2010
4
2007
2
2008
2
2009
2
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