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Goryll, M.
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Mantl, S.
Contribution to a book
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Goryll, M.
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Mantl, S.
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Measurement of the Germanium fraction in strained and relaxed SiGe by Spectroscopic Ellipsometry
Moers, J.
2006
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Vertical p-channel Double-Gate MOSFETs
Moers, J.
2003
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Double gate MOSFET with vertical channel
Moers, J.
2003
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Contribution to a book
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Goryll, M.
Mantl, S.
Moers, J.
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Kordos, P.
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Lüth, H.
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Trellenkamp, Stefan
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von der Hart, A.
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Buca, Dan Mihai
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Caymax, M.
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Hogg, S.
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Kluth, P.
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Loo, R.
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Marso, M.
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Zhao, Q.-T.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Grundlagen für zukünftige Informationstechnologien
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Institut für Halbleiterschichten und Bauelemente; ISG-1
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Center of Nanoelectronic Systems for Information Technology; CNI
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