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Grützmacher, Detlev
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Vastola, G.
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Journal Article
Integration of MOSFETs with SiGe dots as stressor material
Nanver, L.K.
2011
Solid state electronics, 60 (2011) S. 75 - 83
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Bauer, G.
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Grundlagen für zukünftige Informationstechnologien
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Halbleiter-Nanoelektronik; PGI-9
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