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1
Bachhofer, H.
2001
2001
Journal of materials research, 16 (2001) S. 2966
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2
Degradation mechanisms of SrBi2Ta2O9 ferroelectric thin film capacitors during forming gas annealing
Hartner, W.
2000
2000
3
4
Hartner, W.
1999
1999
Integrated ferroelectrics, 27 (1999)
“...Festkörperforschung für die Informationstechnik...”