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Holländer, Bernhard
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Schlom, D. G.
Institut für Halbleiterschichten und Bauelemente; ISG-1
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Holländer, Bernhard
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Schlom, D. G.
Institut für Halbleiterschichten und Bauelemente; ISG-1
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Journal Article
Thermal stability of amorphous LaScO3 films on silicon
Edge, L. F.
2006
Applied physics letters, 89 (2006) S. 062902
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Journal Article
Electrical characterization of amorphous lanthanum aluminate thin films grown by molecular-beam depostition on silicon
Edge, L. F.
2006
Applied physics letters, 88 (2006) S. 112907
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Journal Article
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Edge, L. F.
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Holländer, Bernhard
Schlom, D. G.
Schubert, Jürgen
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Augistin, M. P.
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Lee, T.
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Research Program
Grundlagen für zukünftige Informationstechnologien
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Center of Nanoelectronic Systems for Information Technology; CNI
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Institut für Halbleiterschichten und Bauelemente; ISG-1
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