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Kügeler, C.
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Schroeder, H.
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Ufert, K.-D.
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Waser, R.
Grundlagen für zukünftige Informationstechnologien
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Kügeler, C.
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Grundlagen für zukünftige Informationstechnologien
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Journal Article
Study on the dynamic resistance switching properties of NiO thin films
Kügeler, C.
2010
Thin solid films, 518 (2010) S. 2258 - 2260
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Grundlagen für zukünftige Informationstechnologien
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Elektronische Materialien; IFF-6
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