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Lee, T.
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Schlom, D. G.
Institut für Halbleiterschichten und Bauelemente; ISG-1
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Lee, T.
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Schlom, D. G.
Institut für Halbleiterschichten und Bauelemente; ISG-1
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Journal Article
Thermal stability of amorphous LaScO3 films on silicon
Edge, L. F.
2006
Applied physics letters, 89 (2006) S. 062902
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Grundlagen für zukünftige Informationstechnologien
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